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Helium Ion Microscopy of Corn Starch
Author(s) -
Wulff David,
Aucoin Marc G.,
Gu Frank X.
Publication year - 2020
Publication title -
starch ‐ stärke
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.62
H-Index - 82
eISSN - 1521-379X
pISSN - 0038-9056
DOI - 10.1002/star.201900267
Subject(s) - starch , scanning electron microscope , electron microscope , corn starch , materials science , field ion microscope , helium , microscope , resolution (logic) , wheat starch , ion , microscopy , chemistry , chemical engineering , composite material , optics , biochemistry , physics , computer science , organic chemistry , artificial intelligence , engineering
Abstract Normal corn starch granules are imaged using a helium ion microscope (HIM). This relatively new imaging technique produces high‐resolution images of both the interior and exterior of the granules that allow features to be observed which had previously not been seen with scanning electron microscope. Of particular interest is the mesh‐like structure which is observed in the interior when starch granules are sectioned with a metal blade, a structure not currently part of existing models of starch architecture. HIM imaging provides a new way to characterize starch in the ongoing quest to elucidate its internal structure.