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steel research int. 6/2012
Publication year - 2012
Publication title -
steel research international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.603
H-Index - 49
eISSN - 1869-344X
pISSN - 1611-3683
DOI - 10.1002/srin.201290010
Subject(s) - foil method , scanning electron microscope , stacking , cover (algebra) , scanning transmission electron microscopy , acceleration voltage , materials science , transmission electron microscopy , conventional transmission electron microscope , acceleration , voltage , microscope , crystallography , optics , electron , composite material , nanotechnology , electrical engineering , mechanical engineering , engineering , physics , chemistry , cathode ray , nuclear magnetic resonance , quantum mechanics , classical mechanics
Cover Photo: Scanning transmission electron microscope image taken from a TEM foil in a scanning electron microscope at an acceleration voltage of 30 kV showing individual stacking faults on different (111) planes forming sessile Lomer‐Cotrell‐locks.