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Orientation Relationship between the TRIP Steel Substrate and the ZrO 2 thin Film
Author(s) -
Poklad A.,
Klemm V.,
Schreiber G.,
Rafaja D.,
Abendroth B.,
Haverkamp M.
Publication year - 2011
Publication title -
steel research international
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.603
H-Index - 49
eISSN - 1869-344X
pISSN - 1611-3683
DOI - 10.1002/srin.201100086
Subject(s) - high resolution transmission electron microscopy , materials science , microstructure , cubic zirconia , scanning electron microscope , transmission electron microscopy , substrate (aquarium) , thin film , sputter deposition , ceramic , composite material , crystallography , analytical chemistry (journal) , sputtering , nanotechnology , chemistry , oceanography , chromatography , geology
Distinct orientation relationships between face‐centred cubic austenite (γ‐Fe) and cubic c‐ZrO 2 were found and assigned using high‐resolution transmission electron microscopy (HRTEM) that was complemented by the Fast Fourier Transform (FFT) of the HRTEM micrographs. These orientation relationships were described as [110] γ‐Fe || [111] c‐ZrO 2 and ( $1{\bar {1}}1$ ) γ‐Fe || ( $02\overline {2} $ ) c‐ZrO 2 . They imply the heteroepitaxial growth of the counterparts that improved substantially the adhesion between γ‐Fe and c‐ZrO 2 . The analysed specimens were prepared by magnetron sputtering from an unstabilized ZrO 2 ceramic target in argon atmosphere on TRIP steel substrate. The microstructure of the thin zirconia films was analysed using glancing‐angle x‐ray diffraction (GAXRD), scanning electron microscope (SEM) and TEM.