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Texture distributions imaged by energy dispersive X‐ray diffraction
Author(s) -
Schwarzer Robert A.
Publication year - 1993
Publication title -
steel research
Language(s) - English
Resource type - Journals
eISSN - 1869-344X
pISSN - 0177-4832
DOI - 10.1002/srin.199301573
Subject(s) - collimated light , optics , analytical chemistry (journal) , collimator , physics , x ray , chemistry , chromatography , laser
An X‐ray scanning apparatus has been developed for the study of texture topography and element distributions on bulk sample surfaces. The set‐up consists of a white X‐ray source, a collimator system to produce a narrow primary beam, an x‐y sample stage with stepper motors, and an EDX detecting system. The apparatus is controlled by a microcomputer. The spectrum of secondary X‐rays is composed of broad diffraction peaks, sharp characteristic fluorescence lines, and a low background of scattered radiation. Peak separation and intensity measurement is performed by energy dispersive X‐ray spectroscopy (EDX). The density distributions of selected crystallographic directions or elements in the sample surface are acquired spot by spot, and represented by false‐colour images. Several texture distributions as well as element composition images can be obtained simultaneously. Local resolution is presently limited to 0.2 mm, due to the low intensity of a collimated primary X‐ray beam.