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Texture analysis by electron diffraction
Author(s) -
Schwarzer Robert A.
Publication year - 1991
Publication title -
steel research
Language(s) - English
Resource type - Journals
eISSN - 1869-344X
pISSN - 0177-4832
DOI - 10.1002/srin.199100448
Subject(s) - electron backscatter diffraction , kikuchi line , optics , microbeam , materials science , electron diffraction , diffraction , texture (cosmology) , selected area diffraction , reflection high energy electron diffraction , misorientation , high resolution transmission electron microscopy , scanning electron microscope , transmission electron microscopy , pole figure , resolution (logic) , conventional transmission electron microscope , scanning transmission electron microscopy , microstructure , grain boundary , physics , computer science , composite material , artificial intelligence , image (mathematics)
Electron diffraction methods for the determination of individual grain orientations and selected area diffraction (SAD) pole figures are briefly reviewed. The standard techniques of orientation determination grain‐by‐grain are the interpretation of selected‐area electron spot and microbeam Kikuchi diffraction patterns with a transmission electron microscope (TEM). Electron‐transparent thin samples are required. Specimen areas smaller than 500 nm or 10 nm in diameter, respectively, can be studied. Alternatively, selected area pole figures can be measured on a TEM. This technique is similar to the conventional transmission x‐ray method. The orientations of grains in a bulk sample are obtained with a scanning electron microscope (SEM) from back‐reflection Kikuchi patterns (i.e. electron backscattering patterns) or from channelling patterns. Spatial resolution is approximately 1 μn or 5 μm, respectively. Individual grain orientation and pole figure measurements can be performed on‐line by interfacing the electron microscope with a computer. Outstanding advantages of texture measurement by electron microscopy over x‐ray and neutron diffraction are the ability to image the microstructure of the sampled area which complements texture measurement, and the high spatial resolution in diffraction and imaging modes. Experimental results of individual grain orientation measurement may be represented by inverse pole figures, orientation distribution functions, and misorientation distribution functions.