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Kinetics Study on Carrier Injection‐Induced Degradation and Regeneration at Elevated Temperature in p‐Type Cast‐Monosilicon Passivated Emitter Rear Contact Solar Cells
Author(s) -
Hu Zechen,
He Qiyuan,
Yuan Shuai,
Lin Dehang,
Song Lihui,
Yu Xuegong,
Yang Deren
Publication year - 2021
Publication title -
solar rrl
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.544
H-Index - 37
ISSN - 2367-198X
DOI - 10.1002/solr.202100035
Subject(s) - degradation (telecommunications) , arrhenius plot , common emitter , passivation , materials science , activation energy , kinetics , current (fluid) , analytical chemistry (journal) , regeneration (biology) , open circuit voltage , arrhenius equation , reaction rate constant , chemistry , optoelectronics , composite material , voltage , thermodynamics , electrical engineering , chromatography , layer (electronics) , physics , quantum mechanics , biology , microbiology and biotechnology , engineering
Herein, the degradation and regeneration processes of p‐type cast‐monosilicon passivated emitter rear contact solar cells are investigated, by taking open‐circuit voltage as a measure for the light‐ and elevated‐temperature‐induced degradation (LeTID) and regeneration extent. Degradation and regeneration are triggered by current injection and light soaking at the same temperatures. Then, an Arrhenius plot, derived from the proposed model, is used to extract the degradation and regeneration rate constants of LeTID during both current injection and light‐soaking processes. The activation energies of degradation processes are calculated to be (0.790 ± 0.064) and (0.828 ± 0.013) eV for current injection and light soaking, respectively. The corresponding activation energies for regeneration processes are (1.059 ± 0.112) and (1.179 ± 0.070) eV, respectively. Notably, the similar activation energies indicate that the root cause of the LeTID induced by current injection or light soaking is the same. In addition, an exponential dependence of the rate constants upon the injection current values during the whole degradation and regeneration cycle induced by current injection is observed. These results are not only significant for understanding the kinetics of LeTID but also can shed light on effective LeTID suppression method in the photovoltaic industry.