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Inside Front Cover: Imaging Secondary Electron Emission from a Single Atomic Layer (Small Methods 4/2021)
Author(s) -
Dyck Ondrej,
Swett Jacob L.,
Lupini Andrew R.,
Mol Jan A.,
Jesse Stephen
Publication year - 2021
Publication title -
small methods
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 4.66
H-Index - 46
ISSN - 2366-9608
DOI - 10.1002/smtd.202170013
Subject(s) - graphene , materials science , transmission electron microscopy , cover (algebra) , secondary electrons , front cover , layer (electronics) , image resolution , scanning transmission electron microscopy , electron , cathode ray , optoelectronics , nanotechnology , secondary emission , resolution (logic) , optics , physics , computer science , mechanical engineering , artificial intelligence , engineering , quantum mechanics
In article number 2000950 by Ondrej Dyck and co‐workers, operando prototype graphene devices are examined with a scanning transmission electron microscope. Secondary electron e‐beam induced current (SEEBIC) is used to detect a single layer of graphene and distinguish different layer numbers. SEEBIC imaging offers a complementary view into electrical conductivity and connectivity with high spatial resolution.