Inside Front Cover: Imaging Secondary Electron Emission from a Single Atomic Layer (Small Methods 4/2021) | Zendy

Dyck Ondrej | Zendy; Swett Jacob L. | Zendy; Lupini Andrew R. | Zendy; Mol Jan A. | Zendy; Jesse Stephen | Zendy

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Inside Front Cover: Imaging Secondary Electron Emission from a Single Atomic Layer (Small Methods 4/2021)

Author(s) -

Dyck Ondrej,

Swett Jacob L.,

Lupini Andrew R.,

Mol Jan A.,

Jesse Stephen

Publication year - 2021

Publication title -

small methods

Language(s) - English

Resource type - Reports

SCImago Journal Rank - 4.66

H-Index - 46

ISSN - 2366-9608

DOI - 10.1002/smtd.202170013

Subject(s) - graphene , materials science , transmission electron microscopy , cover (algebra) , secondary electrons , front cover , layer (electronics) , image resolution , scanning transmission electron microscopy , electron , cathode ray , optoelectronics , nanotechnology , secondary emission , resolution (logic) , optics , physics , computer science , mechanical engineering , artificial intelligence , engineering , quantum mechanics

In article number 2000950 by Ondrej Dyck and co‐workers, operando prototype graphene devices are examined with a scanning transmission electron microscope. Secondary electron e‐beam induced current (SEEBIC) is used to detect a single layer of graphene and distinguish different layer numbers. SEEBIC imaging offers a complementary view into electrical conductivity and connectivity with high spatial resolution.

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