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Imaging Secondary Electron Emission from a Single Atomic Layer
Author(s) -
Dyck Ondrej,
Swett Jacob L.,
Lupini Andrew R.,
Mol Jan A.,
Jesse Stephen
Publication year - 2021
Publication title -
small methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.66
H-Index - 46
ISSN - 2366-9608
DOI - 10.1002/smtd.202000950
Subject(s) - graphene , materials science , electron , nanotechnology , yield (engineering) , cathode ray , layer (electronics) , secondary electrons , image resolution , electrical resistivity and conductivity , optoelectronics , optics , composite material , physics , quantum mechanics
Abstract Graphene‐based devices hold promise for a wide range of technological applications. Yet characterizing the structure and the electrical properties of a material that is only one atomic layer thick still poses technical challenges. Recent investigations indicate that secondary‐electron electron‐beam‐induced current (SE‐EBIC) imaging can reveal subtle details regarding electrical conductivity and electron transport with high spatial resolution. Here, it is shown that the SEEBIC imaging mode can be used to detect suspended single layers of graphene and distinguish between different numbers of layers. Pristine and contaminated areas of graphene are also compared to show that pristine graphene exhibits a substantially lower SE yield than contaminated regions. This SEEBIC imaging mode may provide valuable information for the engineering of surface coatings where SE yield is a priority.