Premium
High‐Speed Atomic Force Microscopy: Large‐Range HS‐AFM Imaging of DNA Self‐Assembly through In Situ Data‐Driven Control (Small Methods 7/2019)
Author(s) -
Nievergelt Adrian P.,
Kammer Christoph,
Brillard Charlène,
Kurisinkal Eva,
Bastings Maartje M. C.,
Karimi Alireza,
Fantner Georg E.
Publication year - 2019
Publication title -
small methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.66
H-Index - 46
ISSN - 2366-9608
DOI - 10.1002/smtd.201970022
Subject(s) - atomic force microscopy , in situ , materials science , nanotechnology , range (aeronautics) , microscopy , hexagonal crystal system , optics , crystallography , chemistry , physics , composite material , organic chemistry
In article number 1900031 by Georg E. Fantner and co‐workers, a robust controller design in atomic force microscopy, relying on optimization and experimental data, is able to identify and correct the resonances that appear when imaging at high speed, even in a liquid environment. This technology is used to record in real time the self‐assembly of blunt‐end DNA tripods into large hexagonal lattices.