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Nondestructive Method for the Determination of the Electric Polarization Orientation in Thin Films: Illustration on Gallium Ferrite Thin Films
Author(s) -
Lefevre Chistophe,
Demchenko Anna,
Bouillet Corinne,
Luysberg Martina,
Devaux Xavier,
Roulland François,
Versini Gilles,
Barre Sophie,
Wakabayashi Yusuke,
Boudet Nathalie,
Leuvrey Cédric,
Acosta Manuel,
Meny Christian,
Martin Elodie,
Grenier Stéphane,
FavreNicolin Vincent,
Viart Nathalie
Publication year - 2017
Publication title -
small methods
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 4.66
H-Index - 46
ISSN - 2366-9608
DOI - 10.1002/smtd.201700234
Subject(s) - multiferroics , ferroelectricity , materials science , thin film , pyroelectricity , polarization (electrochemistry) , bismuth ferrite , ferrite (magnet) , gallium , diffraction , optoelectronics , optics , dielectric , nanotechnology , composite material , physics , chemistry , metallurgy
The knowledge and control of the electric polarization in multiferroic thin films is currently the subject of extensive research efforts. This is the key toward a possible transformation into devices of the exciting phenomena such as conductance modification or polarity observed at ferroelectric domain walls. The main methods currently available to determine the polarization characteristics in thin films suffer from being local, time demanding, potentially vitiated by artefacts, or even blinded in some cases. A nondestructive method based on resonant diffraction is proposed for the determination of the polarization orientation in multiferroic, ferroelectric, or pyroelectric thin films. The method is experimentally illustrated for multiferroic gallium ferrite thin films. Its validity is also theoretically shown for the perovskite‐based structure of the emblematic ferroelectric Pb(Zr,Ti)O 3 , which augurs numerous prospects for its potential applications.