Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping (Small 37/2021) | Zendy

Jakob Devon S. | Zendy; Li Nengxu | Zendy; Zhou Huanping | Zendy; Xu Xiaoji G. | Zendy

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Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping (Small 37/2021)

Author(s) -

Jakob Devon S.,

Li Nengxu,

Zhou Huanping,

Xu Xiaoji G.

Publication year - 2021

Publication title -

small

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.785

H-Index - 236

eISSN - 1613-6829

pISSN - 1613-6810

DOI - 10.1002/smll.202170194

Subject(s) - kelvin probe force microscope , microscopy , atomic force microscopy , non contact atomic force microscopy , photoconductive atomic force microscopy , nanotechnology , scanning probe microscopy , materials science , scanning force microscopy , conductive atomic force microscopy , atomic force acoustic microscopy , scanning ion conductance microscopy , magnetic force microscope , chemistry , scanning capacitance microscopy , optics , physics , scanning confocal electron microscopy , magnetization , quantum mechanics , magnetic field

Kelvin Probe Force Microscopy In article number 2102495, Xiaoji G. Xu and co‐workers introduce a novel approach to surface potential imaging with tapping mode Kelvin probe force microscopy without the need for an external AC driving voltage – fully compatible with photoinduced force microscopy for multimodal nano‐imaging.

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