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4D‐STEM: Interferometric 4D‐STEM for Lattice Distortion and Interlayer Spacing Measurements of Bilayer and Trilayer 2D Materials (Small 28/2021)
Author(s) -
Zachman Michael J.,
Madsen Jacob,
Zhang Xiang,
Ajayan Pulickel M.,
Susi Toma,
Chi Miaofang
Publication year - 2021
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.202170142
Subject(s) - materials science , bilayer , optics , lattice (music) , nanoscopic scale , interferometry , scanning transmission electron microscopy , transmission electron microscopy , wavefront , distortion (music) , nanotechnology , optoelectronics , physics , chemistry , membrane , acoustics , amplifier , biochemistry , cmos
The electronic properties of stacked few‐layer 2D materials are highly dependent on their precise structural arrangement. In article number 2100388, featured on the front cover, Michael J. Zachman, Miaofang Chi, and co‐workers describe a four‐dimensional scanning transmission electron microscopy technique that utilizes interference between Bragg discs to enable high‐resolution mapping of picometer‐scale structural reconstructions and measurement of average interlayer spacings in these materials.