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2D Materials: Probing Effective Out‐of‐Plane Piezoelectricity in van der Waals Layered Materials Induced by Flexoelectricity (Small 46/2019)
Author(s) -
Wang Xiang,
Cui Anyang,
Chen Fangfang,
Xu Liping,
Hu Zhigao,
Jiang Kai,
Shang Liyan,
Chu Junhao
Publication year - 2019
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201970250
Subject(s) - van der waals force , flexoelectricity , piezoelectricity , materials science , nanotechnology , condensed matter physics , plane (geometry) , coupling (piping) , composite material , chemistry , physics , molecule , organic chemistry , geometry , mathematics
The piezoelectric property of van der Waals materials is difficult to be collected and quantified experimentally. In article number 1903106, Zhigao Hu and co‐workers present an efficient scanning probe method to quantify the effective out‐of‐plane electromechanical coupling response on 2D layered materials including MoS 2 and InSe by a free‐standing designation.