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Multifunctional Boron‐Doped Diamond Colloidal AFM Probes
Author(s) -
Daboss Sven,
Knittel Peter,
Nebel Christoph E.,
Kranz Christine
Publication year - 2019
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201902099
Subject(s) - materials science , nanotechnology , scanning probe microscopy , diamond , conductive atomic force microscopy , electrode , scanning electrochemical microscopy , boron nitride , electrochemistry , atomic force microscopy , chemistry , composite material
Scanning probe microscopy techniques providing information on conductivity, chemical fluxes, and interfacial reactivity synchronized with topographical information have gained importance within the last decades. Herein, a novel colloidal atomic force microscopy (AFM) probe is presented using a spherical boron‐doped diamond (BDD) electrode attached and electrically connected to a modified silicon nitride cantilever. These conductive spherical BDD–AFM probes allow for electrochemical force spectroscopy. The physical robustness of these bifunctional probes, and the excellent electrochemical properties of BDD renders this concept a unique multifunctional tool for a wide variety of scanning probe studies including conductive AFM, hybrid atomic force–scanning electrochemical microscopy, and tip‐integrated chem/bio sensing.