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Electronic Band Structures: Direct Measurement of Electronic Band Structure in Single Quantum Dots of Metal Chalcogenide Composites (Small 51/2018)
Author(s) -
Benetti Daniele,
Cui Daling,
Zhao Haiguang,
Rosei Federico,
Vomiero Alberto
Publication year - 2018
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201870246
Subject(s) - chalcogenide , quantum dot , materials science , kelvin probe force microscope , graphene , electronic structure , substrate (aquarium) , nanotechnology , metal , quantum , electronic band structure , optoelectronics , charge (physics) , composite material , atomic force microscopy , condensed matter physics , physics , metallurgy , quantum mechanics , oceanography , geology
In article number 1801668 , Federico Rosei, Alberto Vomiero, and co‐workers use Kelvin probe force microscopy to investigate the electrical properties of individual metal chalcogenide quantum dots (QDs) on a graphene‐like substrate. The electronic properties of individual QDs are measured, minimizing any other collective effect. These results can have an impact on engineering charge dynamics in complex systems, where the motion of photoexcited charges has critical importance.