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Molecular Nanoelectronics: Direct Imaging of Space‐Charge Accumulation and Work Function Characteristics of Functional Organic Interfaces (Small 12/2018)
Author(s) -
Siles Pablo F.,
Devarajulu Mirunalini,
Zhu Feng,
Schmidt Oliver G.
Publication year - 2018
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201870051
Subject(s) - ambipolar diffusion , kelvin probe force microscope , nanoelectronics , work function , nanoscopic scale , nanotechnology , materials science , work (physics) , interface (matter) , function (biology) , chemical physics , atomic force microscopy , chemistry , physics , electron , layer (electronics) , quantum mechanics , biology , capillary number , evolutionary biology , capillary action , composite material , thermodynamics
In article number 1703647 , Pablo F. Siles and co‐workers present a complete nanoscale view of surface potential characteristics, and a quantitative overview of work function and energy‐level alignment at the interface of functional metal‐phthalocyanine organic junctions via Kelvin probe microscopy approaches. This opens interesting physical perspectives enabling straightforward correlation between morphology and nanoscale quantification of important electric parameters, revealing details like ambipolar characteristics and interface space‐charge carrier regions.