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Ultrathin Planar Cavity Metasurfaces
Author(s) -
Wang HsiangChu,
Chu Cheng Hung,
Wu Pin Chieh,
Hsiao HuiHsin,
Wu Hui Jun,
Chen JiaWern,
Lee Wei Hou,
Lai YiChieh,
Huang YaoWei,
Tseng Ming Lun,
Chang ShuWei,
Tsai Din Ping
Publication year - 2018
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201703920
Subject(s) - planar , materials science , optics , optoelectronics , polarization (electrochemistry) , silicon , broadband , deflection (physics) , nanometre , phase (matter) , physics , computer science , chemistry , computer graphics (images) , quantum mechanics
An ultrathin planar cavity metasurface is proposed based on ultrathin film interference and its practicability for light manipulation in visible region is experimentally demonstrated. Phase of reflected light is modulated by finely adjusting the thickness of amorphous silicon (a‐Si) by a few nanometers on an aluminum (Al) substrate via nontrivial phase shifts at the interfaces and interference of multireflections generated from the planar cavity. A phase shift of π, the basic requirement for two‐level phase metasurface systems, can be accomplished with an 8 nm thick difference. For proof of concept, gradient metasurfaces for beam deflection, Fresnel zone plate metalens for light focusing, and metaholograms for image reconstruction are presented, demonstrating polarization‐independent and broadband characteristics. This novel mechanism for phase modulation with ultrathin planar cavity provides diverse routes to construct advanced flat optical devices with versatile applications.