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Conductive‐AFM Patterning of Organic Semiconductors
Author(s) -
Brown Benjamin P.,
Picco Loren,
Miles Mervyn J.,
Faul Charl F. J.
Publication year - 2015
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201501779
Subject(s) - conductive atomic force microscopy , materials science , electrical conductor , atomic force microscopy , nanotechnology , conductor , semiconductor , conductive polymer , organic semiconductor , redox , aniline , thin film , optoelectronics , chemical engineering , polymer , composite material , chemistry , organic chemistry , engineering , metallurgy
Using a conductive atomic force microscope (c‐AFM) redox‐writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline‐based organic (semi)‐conductor thin film using a commercial c‐AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.