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Raman Imaging from Microscopy to Nanoscopy, and to Macroscopy
Author(s) -
Zheng Xiaoshan,
Zong Cheng,
Xu Mengxi,
Wang Xiang,
Ren Bin
Publication year - 2015
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201403804
Subject(s) - raman spectroscopy , microscopy , nanotechnology , multiplex , chemical imaging , wafer , atomic force microscopy , materials science , optics , computer science , hyperspectral imaging , physics , artificial intelligence , bioinformatics , biology
Raman spectroscopy can not only provide intrinsic fingerprint information about a sample, but also utilize the merits of the narrow bandwidth and low background of Raman spectra, offering itself as a promising multiplex analytical technique. Raman microscopy has become particularly attractive recently because it has demonstrated itself as an important imaging technique for various samples, from biological samples and chemical systems to industrially important silicon‐based wafers. In this Concept article, some of the most recent advances in Raman imaging techniques are critically reviewed, and the advantages and problems associated with the current techniques are discussed. Particular emphasis is placed on its future directions, from both the technical and application sides.