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Scanning‐Probe Microscopy: Probing Access Resistance of Solid‐State Nanopores with a Scanning‐Probe Microscope Tip (Small 3/2012)
Author(s) -
Hyun Changbae,
Rollings Ryan,
Li Jiali
Publication year - 2012
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201290017
Subject(s) - scanning probe microscopy , materials science , nanopore , microscopy , nanotechnology , microscope , solid state , scanning ion conductance microscopy , scanning electron microscope , vibrational analysis with scanning probe microscopy , scanning capacitance microscopy , scanning confocal electron microscopy , optics , chemistry , composite material , physics
The image features a new apparatus that combines a scanning‐probe microscope and a solid‐state nanopore device. The pore and probe are immersed in an ionic solution where an applied bias voltage creates a current through the pore. The pore is occluded as the probe approaches it, allowing the determination of the 3D access resistance change map outside the nanopore. The device was developed for application in nanopore‐based single‐molecule DNA sequencing.