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In Situ TEM Electromechanical Testing of Nanowires and Nanotubes
Author(s) -
Espinosa Horacio D.,
Bernal Rodrigo A.,
Filleter Tobin
Publication year - 2012
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201200342
Subject(s) - characterization (materials science) , materials science , nanowire , nanotechnology , in situ , nanostructure , nanoscopic scale , transmission electron microscopy , atomic units , physics , quantum mechanics , meteorology
The emergence of one‐dimensional nanostructures as fundamental constituents of advanced materials and next‐generation electronic and electromechanical devices has increased the need for their atomic‐scale characterization. Given its spatial and temporal resolution, coupled with analytical capabilities, transmission electron microscopy (TEM) has been the technique of choice in performing atomic structure and defect characterization. A number of approaches have been recently developed to combine these capabilities with in‐situ mechanical deformation and electrical characterization in the emerging field of in‐situ TEM electromechanical testing. This has enabled researchers to establish unambiguous synthesis‐structure‐property relations for one‐dimensional nanostructures. In this article, the development and latest advances of several in‐situ TEM techniques to carry out mechanical and electromechanical testing of nanowires and nanotubes are reviewed. Through discussion of specific examples, it is shown how the merging of several microsystems and TEM has led to significant insights into the behavior of nanowires and nanotubes, underscoring the significant role in‐situ techniques play in the development of novel nanoscale systems and materials.