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Scanning Transmission X‐Ray Microscopy as a Novel Tool to Probe Colloidal and Photonic Crystals
Author(s) -
van Schooneveld Matti M.,
Hilhorst Jan,
Petukhov Andrei V.,
Tyliszczak Tolek,
Wang Jian,
Weckhuysen Bert M.,
de Groot Frank M. F.,
de Smit Emiel
Publication year - 2011
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201001745
Subject(s) - materials science , colloidal crystal , photonic crystal , scanning confocal electron microscopy , microscopy , micrometer , nanotechnology , transmission electron microscopy , scanning electron microscope , polystyrene , resolution (logic) , scanning ion conductance microscopy , photonics , optics , colloid , scanning probe microscopy , scanning transmission electron microscopy , fluorescence , confocal microscopy , optoelectronics , polymer , chemistry , physics , artificial intelligence , computer science , composite material
Photonic crystals consisting of nano‐ to micrometer‐sized building blocks, such as multiple sorts of colloids, have recently received widespread attention. It remains a challenge, however, to adequately probe the internal crystal structure and the corresponding deformations that inhibit the proper functioning of such materials. It is shown that scanning transmission X‐ray microscopy (STXM) can directly reveal the local structure, orientations, and even deformations in polystyrene and silica colloidal crystals with 30‐nm spatial resolution. Moreover, STXM is capable of imaging a diverse range of crystals, including those that are dry and inverted, and provides novel insights complementary to information obtained by benchmark confocal fluorescence and scanning electron microscopy techniques.