Microscoop for Manipulation of Micro‐objects: Use of Fabricated Cantilever with Atomic Force Microscope | Zendy

WatanabeNakayama Takahiro | Zendy; Machida Shinichi | Zendy; Afrin Rehana | Zendy; Ikai Atsushi | Zendy

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Microscoop for Manipulation of Micro‐objects: Use of Fabricated Cantilever with Atomic Force Microscope

Author(s) -

WatanabeNakayama Takahiro,

Machida Shinichi,

Afrin Rehana,

Ikai Atsushi

Publication year - 2010

Publication title -

small

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.785

H-Index - 236

eISSN - 1613-6829

pISSN - 1613-6810

DOI - 10.1002/smll.201001632

Subject(s) - cantilever , atomic force microscopy , materials science , magnetic force microscope , nanotechnology , microscope , kelvin probe force microscope , atomic force acoustic microscopy , composite material , optics , physics , magnetization , quantum mechanics , magnetic field

Fabricated cantilevers like pushpin removers used in an atomic force microscope allow the manipulation (picking up or putting down) of micro‐objects. A customized cantilever with an appropriate spring constant also allows for the detection of the adhesion force between micro‐objects and a surface, even if these objects are tightly bound.

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