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Microscoop for Manipulation of Micro‐objects: Use of Fabricated Cantilever with Atomic Force Microscope
Author(s) -
WatanabeNakayama Takahiro,
Machida Shinichi,
Afrin Rehana,
Ikai Atsushi
Publication year - 2010
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201001632
Subject(s) - cantilever , atomic force microscopy , materials science , magnetic force microscope , nanotechnology , microscope , kelvin probe force microscope , atomic force acoustic microscopy , composite material , optics , physics , magnetization , quantum mechanics , magnetic field
Fabricated cantilevers like pushpin removers used in an atomic force microscope allow the manipulation (picking up or putting down) of micro‐objects. A customized cantilever with an appropriate spring constant also allows for the detection of the adhesion force between micro‐objects and a surface, even if these objects are tightly bound.