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Tuning Temperature and Size of Hot Spots and Hot‐Spot Arrays
Author(s) -
Saïdi Elika,
Babinet Nicolas,
Lalouat Loïc,
Lesueur Jérôme,
Aigouy Lionel,
Volz Sébastian,
LabéguerieEgéa Jessica,
Mortier Michel
Publication year - 2011
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201001476
Subject(s) - hot spot (computer programming) , materials science , nanodot , silicon , substrate (aquarium) , nanoscopic scale , layer (electronics) , resolution (logic) , thermal , optoelectronics , optics , nanotechnology , composite material , thermodynamics , oceanography , geology , physics , artificial intelligence , computer science , operating system
By using scanning thermal microscopy, it is shown that nanoscale constrictions in metallic microwires deposited on an oxidized silicon substrate can be tuned in terms of temperature and confinement size. High‐resolution temperature maps indeed show that submicrometer hot spots and hot‐spot arrays are obtained when the SiO 2 layer thickness decreases below 100 nm. When the SiO 2 thickness becomes larger, heat is less confined in the vicinity of the constrictions and laterally spreads all along the microwire. These results are in good agreement with numerical simulations, which provide dependences between silica‐layer thickness and nanodot shape and temperature.