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Lifting and Sorting of Charged Au Nanoparticles by Electrostatic Forces in Atomic Force Microscopy
Author(s) -
Xu JiaPeng,
Kwak Kwang Joo,
Lee James L.,
Agarwal Gunjan
Publication year - 2010
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.201000924
Subject(s) - electrostatic force microscope , atomic force microscopy , nanoparticle , nanotechnology , substrate (aquarium) , materials science , photoconductive atomic force microscopy , kelvin probe force microscope , conductive atomic force microscopy , colloidal gold , electrostatics , non contact atomic force microscopy , chemistry , scanning capacitance microscopy , composite material , scanning electron microscope , scanning confocal electron microscopy , oceanography , geology
A new nanoparticle manipulation technique is demonstrated by application of electrostatic forces via the atomic force microscope (AFM) tip. Gold nanoparticles with a specific surface charge or mass could be selectively lifted up from a substrate by controlling the potential applied to the AFM tip.