Lifting and Sorting of Charged Au Nanoparticles by Electrostatic Forces in Atomic Force Microscopy | Zendy

Xu JiaPeng | Zendy; Kwak Kwang Joo | Zendy; Lee James L. | Zendy; Agarwal Gunjan | Zendy

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Lifting and Sorting of Charged Au Nanoparticles by Electrostatic Forces in Atomic Force Microscopy

Author(s) -

Xu JiaPeng,

Kwak Kwang Joo,

Lee James L.,

Agarwal Gunjan

Publication year - 2010

Publication title -

small

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 3.785

H-Index - 236

eISSN - 1613-6829

pISSN - 1613-6810

DOI - 10.1002/smll.201000924

Subject(s) - electrostatic force microscope , atomic force microscopy , nanoparticle , nanotechnology , substrate (aquarium) , materials science , photoconductive atomic force microscopy , kelvin probe force microscope , conductive atomic force microscopy , colloidal gold , electrostatics , non contact atomic force microscopy , chemistry , scanning capacitance microscopy , composite material , scanning electron microscope , scanning confocal electron microscopy , oceanography , geology

A new nanoparticle manipulation technique is demonstrated by application of electrostatic forces via the atomic force microscope (AFM) tip. Gold nanoparticles with a specific surface charge or mass could be selectively lifted up from a substrate by controlling the potential applied to the AFM tip.

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