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Probe Tips Functionalized with Colloidal Nanocrystal Tetrapods for High‐Resolution Atomic Force Microscopy Imaging
Author(s) -
Nobile Concetta,
Ashby Paul D.,
Schuck P. James,
Fiore Angela,
Mastria Rosanna,
Cingolani Roberto,
Manna Liberato,
Krahne Roman
Publication year - 2008
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.200800604
Subject(s) - nanocrystal , nanotechnology , materials science , atomic force microscopy , colloid , microscopy , resolution (logic) , high resolution , chemical engineering , optics , physics , remote sensing , artificial intelligence , geology , computer science , engineering
Tetrapods have the unique property of self‐aligning on a flat surface with one arm pointing in the direction perpendicular to the surface plane. The positioning of single tetrapods on the flattened tip of commercial AFM probes (see image) is reported. These tetrapod‐functionalized AFM probes are used to image the topography of different samples revealing excellent spatial and vertical resolution.