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High‐Spatial‐Resolution Surface‐Temperature Mapping Using Fluorescent Thermometry
Author(s) -
Löw Peter,
Kim Beomjoon,
Takama Nobuyuki,
Bergaud Christian
Publication year - 2008
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.200700581
Subject(s) - materials science , fluorescence , rhodamine , image resolution , nanowire , temperature measurement , resolution (logic) , characterization (materials science) , nanotechnology , rhodamine b , silicon , surface (topology) , analytical chemistry (journal) , optoelectronics , optics , chemistry , thermodynamics , chromatography , physics , geometry , mathematics , artificial intelligence , computer science , biochemistry , photocatalysis , catalysis
Fluorescent thermometry presents a cheap and efficient alternative for small‐scale thermal characterization. The use of dried Rhodamine B (see image) as a probe for surface‐temperature mapping is demonstrated. The approach is applied in the evaluation of the temperature distribution along resistively heated micro‐ and nanowires. The temperature is found to be highly uniform along metal wires on silicon.