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High‐Speed Nanometer‐Scale Imaging for Studies of Nanowire Mechanics
Author(s) -
Hessman Dan,
Lexholm Monica,
Dick Kimberly A.,
GhatnekarNilsson Sara,
Samuelson Lars
Publication year - 2007
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.200700221
Subject(s) - nanowire , oscillation (cell signaling) , noise (video) , diffraction , tracking (education) , wavelength , bending , position (finance) , limit (mathematics) , nanotechnology , optics , physics , materials science , optoelectronics , computer science , image (mathematics) , computer vision , chemistry , mathematics , mathematical analysis , composite material , psychology , pedagogy , biochemistry , finance , economics
The ideal shape of nanowires means that their position within an optical image can be determined with a precision given by the signal‐to‐noise ratio rather than by the wavelength. This is the basis for a stroboscopic imaging technique capable of tracking the bending and oscillation of a single nanowire in space and time (see image). The achieved precision is below 1 nm, more than two orders of magnitude better than the diffraction limit.