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Monitoring and Analyzing Nonlinear Dynamics in Atomic Force Microscopy
Author(s) -
Hersam Mark C.
Publication year - 2006
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.200600272
Subject(s) - nonlinear system , cantilever , atomic force microscopy , chaotic , dynamics (music) , nanotechnology , materials science , mechanics , physics , classical mechanics , acoustics , computer science , composite material , quantum mechanics , artificial intelligence
Nonlinear AFM dynamics : Despite its importance in many nanomanipulation experiments, most intermittent contact atomic force microscopes do not monitor the nonlinear response of the oscillating cantilever. A recent study provides an effective strategy for measuring and analyzing these nonlinear tip–sample dynamics (see figure). Interestingly, distinct nonlinear regimes are identified – including a chaotic mode – at small tip–sample spacings.