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Local Secondary‐Electron Emission Spectra via Scanning Probe Energy Loss Spectroscopy
Author(s) -
Yin Jinlong,
Pulisciano Adriano,
Palmer Richard E.
Publication year - 2006
Publication title -
small
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.785
H-Index - 236
eISSN - 1613-6829
pISSN - 1613-6810
DOI - 10.1002/smll.200500491
Subject(s) - electron energy loss spectroscopy , spectroscopy , scanning electron microscope , scanning tunneling microscope , scanning tunneling spectroscopy , materials science , energy dispersive x ray spectroscopy , electron , resolution (logic) , emission spectrum , spectral line , scanning transmission electron microscopy , x ray photoelectron spectroscopy , atomic physics , optics , analytical chemistry (journal) , nanotechnology , chemistry , physics , nuclear magnetic resonance , transmission electron microscopy , quantum mechanics , astronomy , artificial intelligence , chromatography , computer science
The magic of SPELS : Scanning probe energy loss spectroscopy (SPELS) can be viewed as a hybrid (see figure) between scanning tunneling microscopy (STM) and electron energy loss spectroscopy (EELS). As the spatial resolution of SPELS is in the 10‐nm regime, the way is opened to true nanometer‐scale band‐structure measurements.