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Characterization of a non‐organofunctional silane film deposited on Al, Zn and Al–43.4Zn–1.6Si alloy‐coated steel
Author(s) -
Bexell Ulf,
Olsson Mikael
Publication year - 2001
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.976
Subject(s) - silane , aluminium , zinc , secondary ion mass spectrometry , chemistry , alloy , silicon , metal , mass spectrum , analytical chemistry (journal) , mass spectrometry , substrate (aquarium) , inorganic chemistry , chromatography , organic chemistry , oceanography , geology
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used to analyse the interface between a non‐organofunctional silane and three different metal substrates (aluminium, zinc and an aluminium–zinc alloy). Ion etching using Ga + ions was used to expose the interfacial region. Ion fragments from the samples were examined carefully where supposed metal–oxygen–silicon ion fragments should appear in the mass spectra. From high mass resolution spectra it was concluded that there exists an AlOSi + ion fragment at nominal mass m / z = 71 amu on the aluminium and aluminium–zinc alloy substrates and a ZnOSi + ion fragment at nominal mass m / z = 108 amu on the zinc and aluminium–zinc alloy substrates. These results are further enhanced by the fact that the characteristic ion pattern of ZnOSi + ‐type ion fragments, composed of different naturally stable zinc and silicon isotopes, in the mass range m / z = 108–112 amu showed the expected relative peak height relations. The presence of these metal–oxygen–silicon ion fragments is a strong indication that chemical interaction between the silane and the metal substrates exists and that the nature of this interaction is due to the formation of a covalent bond between the silane and the metal substrate. Copyright © 2001 John Wiley & Sons, Ltd.