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Electronic structure of tin oxides: High‐resolution study of XPS and Auger spectra
Author(s) -
Kövér L.,
Kovács Zs.,
Sanjinés R.,
Moretti G.,
Cserny I.,
Margaritondo G.,
Pálinkás J.,
Adachi H.
Publication year - 1995
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740230705
Subject(s) - auger , tin , spectral line , x ray photoelectron spectroscopy , chemistry , valence (chemistry) , crystallite , analytical chemistry (journal) , electronic structure , polarizability , atomic physics , crystallography , computational chemistry , nuclear magnetic resonance , molecule , physics , astronomy , organic chemistry , chromatography
High‐resolution core and valence band photoemission as well as photoinduced Auger spectra of metallic Sn, polycrystalline SnO and SnO 2 ((110) natural single‐crystal cassiterite and polycrystalline) samples were measured in order to give information on local electronic and geometric structures around the core‐ionized atoms and for providing data for facilitating quantitative analysis of systems containing these species. The SnO surfaces were obtained without the use of ion sputtering by using a special preparation procedure based on in vacuo surface scraping. The respective experimental valence band spectra could be utilized in quantitative analysis of layered tin oxide structures. Valence band spectral shapes are compared to spectra calculated by using a cluster‐type (DV‐Xα) MO model. From the Sn Auger parameter measurements, using a simple electrostatic model, the similarity of the initial‐state effects for the two oxides was deduced, while the oxygen Auger parameter values indicated large polarizability and the respective final‐state hole–hole repulsion energies were determined.