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Atomic force microscopy investigations on polymer latex films
Author(s) -
Anczykowski B.,
Chi L. F.,
Fuchs H.
Publication year - 1995
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740230614
Subject(s) - atomic force microscopy , polystyrene , cantilever , conductive atomic force microscopy , materials science , monolayer , polymer , adhesive , microscopy , composite material , thin film , nanotechnology , optics , layer (electronics) , physics
Atomic force microscopy (AFM) is applied on two different types of thin latex films. Polystyrene dispersion particles are prepared by various methods to form well‐ordered monolayers and multilayers. Atomic force microscopy serves as a tool to study the surface structures of such films and to find the optimal preparation conditions. The micromorphology of the second system, an adhesive tape, was imaged successfully by AFM running in dynamic mode. Besides the morphological studies, the interaction between the sticky surface and the AFM tip is measured by the damping of the cantilever oscillation versus tip–sample distance.