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Analysis of polymers by auger electron spectroscopy with a cold stage
Author(s) -
Sekine Tetsu,
Ikeo Nobuyuki,
Nagasawa Yuji,
Kikuma Jun
Publication year - 1995
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740230608
Subject(s) - auger electron spectroscopy , electron beam processing , electron microprobe , irradiation , analytical chemistry (journal) , electron , polymer , tilt (camera) , chemistry , cathode ray , range (aeronautics) , electron spectroscopy , materials science , atomic physics , composite material , physics , mineralogy , nuclear physics , mechanical engineering , organic chemistry , chromatography , engineering
In order to analyse polymers by AES, the electron discharge from the sample surface and the reduction of electron irradiation damage must be taken into account. A cooling device for a scanning Auger microprobe was developed that allows five axis movements, especially allowing a large dynamic range of tilt movement. The electron beam irradiation effects were examined for CI LVV and C KLL transitions at temperatures of −185, −150, −100 and 24°C using slices of polyvinyl chloride specimen of ∼200 nm in thickness. At −185°C, the allowed dosage for the analysis without causing any remarkable damage is up to 0.3 C cm −2 . The electron dosage effects are not so strong. The logarithmic concentration ratio log( C cl / C c ) falls down linearly against the logarithmic electron dosage log(electron dose) with a slope of about −0.22. At higher temperatures the damage take place immediately after electron irradiation, and it cannot be avoided. This immediate damage is not due to the dosage effects but to the temperature elevation.