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Scanning force microscopy analysis of the surface of ion‐irradiated diamond
Author(s) -
Demanet C. M.,
Shrivastava S.,
Sellschop J. P. F.
Publication year - 1995
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740230212
Subject(s) - diamond , scanning force microscopy , materials science , irradiation , substrate (aquarium) , microscopy , ion , chemical vapor deposition , atomic force microscopy , field ion microscope , scanning ion conductance microscopy , electric field , scanning probe microscopy , analytical chemistry (journal) , scanning electron microscope , nanotechnology , chemistry , optics , scanning confocal electron microscopy , composite material , physics , oceanography , organic chemistry , chromatography , quantum mechanics , geology , nuclear physics
The surface of a natural diamond substrate, a chemical vapour‐deposited diamond epilayer and ion‐irradiated regions are compared using scanning force microscopy. Differences are reported in terms of microtopography, force modulation, lateral force and electric field gradient images.