AES and SAM studies of oxide formation on Inconel 600 at high temperatures | Zendy

Alstrup N. C. | Zendy; Langvad N. | Zendy; Chorkendorff I. | Zendy

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AES and SAM studies of oxide formation on Inconel 600 at high temperatures

Author(s) -

Alstrup N. C.,

Langvad N.,

Chorkendorff I.

Publication year - 1994

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740220194

Subject(s) - inconel , oxide , alloy , materials science , partial pressure , metallurgy , layer (electronics) , analytical chemistry (journal) , atmospheric pressure , oxygen , chemistry , nanotechnology , chromatography , geology , organic chemistry , oceanography

Characterization of the oxide formed on a Ni‐based alloy (Inconel 600) at high temperatures has been carried out using AES and SAM combined with ion‐etched depth profiling. The oxidation experiment was done at 1000 °C, in atmospheric air and under mild (H 2 /H 2 O) oxidation conditions. In air, the resulting surface is highly inhomogeneous, featuring large Ni‐rich islands on top of a continuous Cr‐rich oxide layer. When the oxygen partial pressure (H 2 /H 2 O) was lowered, the Ni‐rich layer was not formed.

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