XPS analysis of lithium intercalation in thin films of molybdenum oxysulphides | Zendy

Benoist L. | Zendy; Gonbeau D. | Zendy; PfisterGuillouzo G. | Zendy; Schmidt E. | Zendy; Meunier G. | Zendy; Levasseur A. | Zendy

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XPS analysis of lithium intercalation in thin films of molybdenum oxysulphides

Author(s) -

Benoist L.,

Gonbeau D.,

PfisterGuillouzo G.,

Schmidt E.,

Meunier G.,

Levasseur A.

Publication year - 1994

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.740220146

Subject(s) - molybdenum , x ray photoelectron spectroscopy , intercalation (chemistry) , thin film , lithium (medication) , ion , redox , materials science , inorganic chemistry , chemistry , chemical engineering , nanotechnology , organic chemistry , medicine , endocrinology , engineering

Thin films of molybdenum oxysulphides which could be used as positive electrode materials in microbatteries were analysed by XPS. The results have shown the existence of a new environment for molybdenum with S 2 2− pairs, S 2− and O 2− ions. The evolution of these thin films MoOySz at different stages of their cycle in experimental generators has also been studied; the main elements involved in the redox processes have been characterized: molybdenum atoms with +6 formal oxidation number and disulphide pairs S 2 2− .

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