Premium
Factor analysis, a useful tool for solving analytical problems in AES and XPS: A study of the performances and limitations of the indicator function
Author(s) -
Arranz A.,
Palacio C.
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740220123
Subject(s) - principal component analysis , limit (mathematics) , function (biology) , sensitivity (control systems) , x ray photoelectron spectroscopy , principal (computer security) , statistics , analytical chemistry (journal) , computer science , mathematics , chemistry , mathematical analysis , engineering , physics , environmental chemistry , nuclear magnetic resonance , evolutionary biology , electronic engineering , biology , operating system
Computer simulations have been used in order to investigate an objective procedure to determine the number of principal factors when factor analysis is used for solving analytical problems in AES and XPS. The indicator (IND) function has been used in the investigation. The simulated results show that the IND function could be used for detecting and solving sampling misalignment problems. Furthermore, the S/N ratio, the severe overlap of spectra and the relative importance of the various factors involved can limit the sensitivity of the IND function to determine the correct number of principal factors.