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An XPS valence band study of alkane chains secondary structure
Author(s) -
Riga J.,
Delhalle J.,
Deleuze M.,
Pireaux J. J.,
Verbist J. J.
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.7402201107
Subject(s) - x ray photoelectron spectroscopy , valence (chemistry) , alkane , spectral line , valence band , polyethylene , materials science , chemistry , crystallography , chemical physics , band gap , nuclear magnetic resonance , physics , hydrocarbon , organic chemistry , optoelectronics , astronomy
Valence XPS studies of well oriented polyethylene mats, deposited on a gold substrate, provide direct evidence of the existence of the fold structure at the sample surface and confirm earlier suggestions that conformation is directly fingerprinted in that energy region of the spectra. These results also provide new insight into the origin of the valence XPS spectra differences, so far unexplained, of n‐tridecane recorded in gas and solid phase.