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Dependence of SERS signal on surface roughness
Author(s) -
Kruszewski Stefan
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740211203
Subject(s) - surface roughness , surface finish , raman scattering , electrode , materials science , signal (programming language) , scanning electron microscope , transmission electron microscopy , scattering , optics , raman spectroscopy , intensity (physics) , microscopy , analytical chemistry (journal) , chemistry , nanotechnology , composite material , physics , chromatography , computer science , programming language
The roughness of the silver electrode was changed by variation of parameters of the oxidation–reduction procedure. The roughness size has been estimated qualitatively from the angle distribution of elastically scattered light. Quantitatively measurement of roughness by scanning electron microscopy and transmission electron microscopy also have been performed. Investigations of surface‐enhanced Raman scattering (SERS) intensity as a function of parameters of oxidation‐reduction cycle procedure and electrode roughness have been performed. The experimentally observed relationship between the roughness size and SERS signal is compared with the predictions of the classical electromagnetic enhancement model.