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Inhomogeneous charge effect on a natural mineral studied by XPS
Author(s) -
Rueda F.,
Mendialdua J.,
Rodríguez A.,
Casanova R.,
Barbaux Y.,
Gengembre L.,
Jalowiecki L.,
Bouqueniaux D.
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740210910
Subject(s) - x ray photoelectron spectroscopy , mineral , charge (physics) , natural mineral , analytical chemistry (journal) , chemistry , mineralogy , materials science , physics , nuclear magnetic resonance , metallurgy , environmental chemistry , quantum mechanics
We report on XPS results that show an inhomogeneous charge effect, greater than 1.0 eV and far greater than the accuracy of the measurements (∼0.2 eV), exhibited by a natural mineral essentially composed of SiO 2 and Fe 2 O 3 . This mineral has proved to be an efficient catalyst in a Fischer–Tropsch reaction. We have corrected this differential charge effect by using two internal references in order to interpret satisfactorily our XPS data.