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Determination of surface stoichiometry in polycrystalline alloys by a crystallographic electron attenuation model: Application to the Ce/Rh system
Author(s) -
Andersen J. E. T.,
Warren J. P.,
Zhang X.,
Lambert R. M.
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740210811
Subject(s) - crystallite , alloy , materials science , cerium , stoichiometry , attenuation length , auger electron spectroscopy , analytical chemistry (journal) , electron , substrate (aquarium) , auger , crystallography , phase (matter) , chemistry , metallurgy , atomic physics , optics , physics , oceanography , organic chemistry , chromatography , nuclear physics , geology , quantum mechanics
Abstract In order to obtain quantitative surface compositional information, an earlier crystallographic electron attenuation model has been extended to treat polycrystalline alloys. Simple correction factors are obtained that yield large corrections to elemental Auger intensity ratios. The model has been applied to a binary surface alloy formed by heating cerium overlayers on a polycrystalline rhodium substrate. It is shown that an alloy film is formed whose thickness is proportional to the number of Ce layers initially deposited. The surface alloy is identified as Ce 3 Rh 2 , which corresponds to a known bulk phase.