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XPS and static SIMS studies of copoly(ether–esters) containing mixed polyether soft blocks
Author(s) -
Burrell Michael C.,
Bhatia Qamar S.,
Michael R. S.
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740210807
Subject(s) - copolymer , x ray photoelectron spectroscopy , ethylene oxide , propylene oxide , polymer chemistry , ether , ethylene glycol , oxide , chemistry , polybutylene terephthalate , secondary ion mass spectrometry , static secondary ion mass spectrometry , ion , materials science , polymer , chemical engineering , organic chemistry , polyester , engineering
The surface compositions for a series of copoly(ether–esters) are determined from XPS and static SIMS measurements. The copolymers consist of a polybutylene terephthalate (PBT) hard block and a mixed soft block of two of the following polyethers—poly(propylene glycol) (PPG), poly(tetramethylene) oxide (PTMO) and poly(ethylene oxide) (PEO). The surfaces of all the copolymers are enriched in the total polyether soft blocks. Quantification of XPS intensities shows the presence of both polyethers at the surface of these mixed soft‐block copolymers, in relative amounts close to the bulk formulations. In the static SIMS measurements, direct observation of characteristic fragment ions related to the specific polyethers confirms their presence and relative abundance in the surface.