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Sputter‐Induced effects on quantitative GD‐OES depth profiles from hot‐dip zinc‐coated steel
Author(s) -
Karlsson Jörgen,
Hörnström Sven Erik,
Klang Hans,
Nilsson JanOlov
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740210607
Subject(s) - galvanization , intermetallic , sputtering , coating , materials science , metallurgy , zinc , microstructure , aluminium , auger electron spectroscopy , galvannealed , surface finish , analytical chemistry (journal) , composite material , alloy , layer (electronics) , chemistry , thin film , physics , chromatography , nuclear physics , nanotechnology
Depth profiling using glow discharge optical emission spectroscopy (GD‐OES) is sometimes used by the steel industry to determine the composition of the zinc coating of hot‐dip galvanized steel. It has been observed that the shape of the aluminium profile from an intermetallic phase between the zinc coating and the steel varies from sample to sample, and that the phase is much wider than expected. We have used scanning Auger microscopy (SAM) to study the surface composition and topography of GD‐OES sputtering craters. A surface roughness is introduced during sputtering that considerably deteriorates the depth resolution. The shape of the GD‐OES depth profile in the intermetallic region is related to the microstructure of the zinc coating.