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Use of image depth profiling SIMS for the study of tinplate corrosion
Author(s) -
Lu S. F.,
Mount G. R.,
McIntyre N. S.,
Fenster A.
Publication year - 1994
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740210303
Subject(s) - tin , corrosion , secondary ion mass spectrometry , metallurgy , materials science , alloy , ion , analytical chemistry (journal) , chemistry , environmental chemistry , organic chemistry
Four tinplate specimens with different corrosion properties were studied using secondary ion mass spectrometry (SIMS) image analysis. The continuity of the structure of the interfacial iron‐tin alloy was able to be examined using a volume rendition computer program, which generates a three‐dimensional representation of the stack of ion images. The surface coverage of tinplate was found to vary widely on some specimens; those exhibiting poor corrosion characteristics were found to have little or no elemental tin covering the raised regions between the rolling grooves.