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Photoemission study of an AuPdAu(111) multilayer grown by MBE
Author(s) -
Cole R. J.,
Evans J. A.,
Gregory D. A. C.,
Unsworth P.,
Weightman P.,
Greig D.,
Walker M. J.,
Beamson G.
Publication year - 1993
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740201107
Subject(s) - x ray photoelectron spectroscopy , spectral line , molecular beam epitaxy , fermi level , valence (chemistry) , monolayer , metal , photoemission spectroscopy , chemistry , materials science , analytical chemistry (journal) , epitaxy , atomic physics , layer (electronics) , nuclear magnetic resonance , nanotechnology , physics , organic chemistry , astronomy , quantum mechanics , chromatography , electron
An au/Pd/Au(111) multilayer system grown by molecular beam epitaxy has been studied by high‐resolution x‐ray photoelectron spectroscopy. An analysis of the dependence of the relative intensity of the Au and Pd core‐level XPS lines on the take‐off angle indicates that the thickness of the Pd sandwhich layer is ∼5 monolayers. The photoelectron spectra show the presence of more than one chemical environment for each element and suggest that the core‐level photoelectron spectra of Pd atoms in the interfacial layers and the inner layers of the Pd sandwich are split by ∼0.6 eV. The photoelectron spectra of the valence band show that the Pd sandwich retains the high density of states at the Fermi energy that is characteristic of Pd metal.