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Photoelectron and ion scattering spectroscopy of zeolites under reduced surface‐charge conditions
Author(s) -
Grünert Wolfgang,
Schlögl Robert,
Karge Hellmut G.
Publication year - 1993
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740200711
Subject(s) - x ray photoelectron spectroscopy , analytical chemistry (journal) , ion , conductivity , spectroscopy , lanthanum , chemistry , surface charge , materials science , inorganic chemistry , nuclear magnetic resonance , physics , organic chemistry , chromatography , quantum mechanics
For zeolites that exhibit ion conductivity, the surface charge in the application of surface spectroscopy (XPS, UPS, ISS) may be significantly reduced by using elevated measurement temperatures. On this basis, a measurement technique has been developed that allows the application of ISS and UPS to zeolites and the detection of differential charging effects in XPS. Both the new perspectives and the limitations of this technique are illustrated by examples of Y zeolites exchanged with lanthanum and with silver.