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X‐ray photoelectron spectroscopic (XPS) study of DeNO x catalysts after exposure to slag tap furnace flue gas
Author(s) -
Rademacher I.,
Borgmann D.,
Hopfengärtner G.,
Wedler G.,
Hums E.,
Spitznagel G. W.
Publication year - 1993
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740200108
Subject(s) - x ray photoelectron spectroscopy , flue gas , catalysis , chemistry , x ray , flue , chemical engineering , waste management , organic chemistry , physics , engineering , quantum mechanics
X‐ray photoelectron spectroscopy has been used to investigate the composition of both the surface of DeNO x catalysts (Ti:Mo:V = 92:6:2 and Ti:W:V = 85:10:5 at.%) and the material deposited from the flue gas. In spite of the charging of the surface in the spectrometer, it was possible to perform both qualitative and quantitative analysis. The deposits primarily contain Ca, Si, O, S, As, P and N. Oxidation numbers of Ca, Si, Ti, Mo, W, S and N were determined from chemical shifts in combination with line widths. There are, however, problems with the determination of the oxidation state of As owing to an influence of the exciting Al Kα radiation on the oxidation state. Nevertheless, As seems to exist both as As 3+ and As 5+ .