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Influence of surface preparation on oxidation of stainless steels at high temperature
Author(s) -
Guillamet R.,
Lenglet M.,
Gazin L.,
Hannoyer B.,
Lopitaux J.
Publication year - 1993
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740200104
Subject(s) - specular reflection , materials science , oxide , infrared , analytical chemistry (journal) , diffuse reflection , secondary ion mass spectrometry , metallurgy , mass spectrometry , spinel , chemistry , optics , physics , chromatography
Fourier transform infrared specular reflectance spectra at variable incidence have been recorded in order to characterize the oxide layers formed on both mechanically polished and etched surfaces of stainless steels (AISI 304 and 316). Depending on the surface preparation, the major oxides are either Cr 2 O 3 and MnCr 2 O 4 for polished samples or α‐Fe 2 O 3 and Fe 3 O 4 for etched samples in the early stages of the oxidation in air at 900°C. Secondary ion mass spectrometry depth profiles confirm the schematic structure of oxide films (developed on polished surfaces during longer exposures) deduced from infrared reflectance study.