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Extended energy loss fine structure and x‐ray photoelectron spectroscopy studies of clean and oxidized Fe thin films on polycrystalline Cu
Author(s) -
Di Nardo S.,
Lozzi L.,
Passacantando M.,
Picozzi P.,
Santucci S.,
De Crescenzi M.,
Den Daas H.
Publication year - 1992
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.740190190
Subject(s) - x ray photoelectron spectroscopy , auger , copper , crystallite , thin film , auger electron spectroscopy , analytical chemistry (journal) , binding energy , photoemission spectroscopy , chemistry , valence (chemistry) , substrate (aquarium) , materials science , crystallography , atomic physics , metallurgy , nuclear magnetic resonance , nanotechnology , physics , oceanography , organic chemistry , chromatography , geology , nuclear physics
The electronic and structural properties of very thin iron films deposited in ultrahigh vacuum on polycrstalline copper have been studied by x‐ray photoemission and Auger spectroscopies and the extended energy loss fine structure technique beyond the L 2, 3 edges of iron. Shifts in both core level and valence band binding energies together with a decrease in nearest‐neighbour distance are consistent with a cluster growth picture. Successive oxidation and thermal treatments have shown a selectivity towards oxidation of the iron deposits with respect to the copper substrate and a restoration of the cleanness of the iron deposit after thermal treatment.